Invention Grant
- Patent Title: Deposit removal method
- Patent Title (中): 存款清除方法
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Application No.: US14116952Application Date: 2012-05-10
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Publication No.: US09126229B2Publication Date: 2015-09-08
- Inventor: Shigeru Tahara , Eiichi Nishimura , Hiroshi Tomita , Tokuhisa Ohiwa , Hisashi Okuchi , Mitsuhiro Omura
- Applicant: Shigeru Tahara , Eiichi Nishimura , Hiroshi Tomita , Tokuhisa Ohiwa , Hisashi Okuchi , Mitsuhiro Omura
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Rothwell, Figg, Ernst & Manbeck, P.C.
- Priority: JP2011-106464 20110511
- International Application: PCT/JP2012/003070 WO 20120510
- International Announcement: WO2012/153534 WO 20121115
- Main IPC: B05D3/14
- IPC: B05D3/14 ; H01L21/02 ; H01L21/311

Abstract:
A deposit removal method for removing deposits deposited on the surface of a pattern formed on a substrate by etching, includes an oxygen plasma treatment process for exposing the substrate to oxygen plasma while heating the substrate and a cycle treatment process for, after the oxygen plasma treatment process, repeating multiple cycles of a first period and a second period. In the first period, the substrate is exposed to a mixture of hydrogen fluoride gas and alcohol gas inside a processing chamber and the partial pressure of the alcohol gas is set to the first partial pressure. In the second period, the partial pressure of the alcohol gas is set to the second partial pressure lower than the first partial pressure by exhausting the inside of the processing chamber.
Public/Granted literature
- US20140083979A1 DEPOSIT REMOVAL METHOD Public/Granted day:2014-03-27
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