Invention Grant
- Patent Title: Shape measurement method for combining partial measurements
- Patent Title (中): 用于组合部分测量的形状测量方法
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Application No.: US13355715Application Date: 2012-01-23
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Publication No.: US09127939B2Publication Date: 2015-09-08
- Inventor: Yasushi Iwasaki
- Applicant: Yasushi Iwasaki
- Applicant Address: JP
- Assignee: CANON KABUSHIKI KAISHA
- Current Assignee: CANON KABUSHIKI KAISHA
- Current Assignee Address: JP
- Agency: Rossi, Kimms & McDowell LLP
- Priority: JP2011-014381 20110126
- Main IPC: G01B21/20
- IPC: G01B21/20 ; G06F15/00 ; G01B21/04 ; G01B11/255

Abstract:
The present invention provides a stitch measurement method for making a plurality of partial measurements, and obtaining an overall shape by combining partial measurement results, including a step of dividing, on lattices, each peripheral partial measurement region including an external portion of an overall measurement region into a first region inside the overall measurement region and a second region outside the overall measurement region, and dividing each central partial measurement region which does not include any external portion of the overall measurement region into a first region and a second region according to division patterns of the peripheral partial measurement region, a step of formulating first orthogonal function sequences on the first regions, and a step of defining linear combinations of respective functions of the first orthogonal function sequences on the first regions as first system errors for the respective partial measurement regions on the overall measurement region.
Public/Granted literature
- US20120191411A1 SHAPE MEASUREMENT METHOD FOR COMBINING PARTIAL MEASUREMENTS Public/Granted day:2012-07-26
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