Invention Grant
- Patent Title: High temperature, high bandwidth pressure acquisition system
- Patent Title (中): 高温,高带宽压力采集系统
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Application No.: US14076835Application Date: 2013-11-11
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Publication No.: US09127993B2Publication Date: 2015-09-08
- Inventor: Anthony D. Kurtz , Alexander A. Ned , Joseph R. VanDeWeert
- Applicant: Nora Kurtz , KULITE SEMICONDUCTOR PRODUCTS, INC.
- Applicant Address: US NJ Leonia
- Assignee: Kulite Semiconductor Products, Inc.
- Current Assignee: Kulite Semiconductor Products, Inc.
- Current Assignee Address: US NJ Leonia
- Agency: Troutman Sanders LLP
- Agent James E. Schutz; Mark Lehi Jones
- Main IPC: G01L19/04
- IPC: G01L19/04 ; G01L9/00 ; G01L15/00 ; G01M9/06 ; G01L9/06

Abstract:
A method, device and system are provided for measuring multiple pressures under severe conditions. In one embodiment, a method comprises receiving, by a processor, from a first sensor, a first pressure signal; receiving, by the processor, from a second sensor, a second pressure signal; receiving, by the processor, from a first memory, a first correction coefficient for the first sensor; receiving, by the processor, from a second memory, a second correction coefficient for the second sensor; modifying, by the processor, the first pressure signal using the first correction coefficient to generate a first corrected pressure signal; modifying, by the processor, the second pressure signal using the second correction coefficient to generate a second corrected pressure signal; and outputting, by the processor, the first corrected pressure signal and the second corrected pressure signal.
Public/Granted literature
- US20140067288A1 High Temperature, High Bandwidth Pressure Acquisition System Public/Granted day:2014-03-06
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