Invention Grant
- Patent Title: Testing apparatus
- Patent Title (中): 测试仪器
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Application No.: US13626990Application Date: 2012-09-26
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Publication No.: US09128001B2Publication Date: 2015-09-08
- Inventor: Fu-Ming Liu
- Applicant: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD. , HON HAI PRECISION INDUSTRY CO., LTD.
- Applicant Address: CN Shenzen TW New Taipei
- Assignee: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.,HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.,HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee Address: CN Shenzen TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: CN201110446770 20111228
- Main IPC: G01M7/02
- IPC: G01M7/02 ; G01D11/16

Abstract:
A testing apparatus includes a testing platform, a tray attached to the testing platform and substantially perpendicular to the testing platform, a pressing member substantially parallel to the testing platform and slidably attached to the tray, and a resilient member located between the tray and the pressing member. The pressing member is slidable relative to the tray between a first position and a second position. When the pressing member is located on the first position, a first distance is defined between the pressing member and the testing platform, for receiving an electronic device between the pressing member and the testing platform. When the pressing member is located on the second position, the resilient member is deformed, and a second distance, that is greater than the first distance is defined between the pressing member and the testing platform, for disengaging the electronic device from the testing platform.
Public/Granted literature
- US20130167670A1 TESTING APPARATUS Public/Granted day:2013-07-04
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