Invention Grant
US09128013B2 Sampler for taking samples from melts having a melting point higher than 600 ° C. and method for taking samples
有权
用于从熔点高于600℃的熔体中取样的取样器以及取样的方法
- Patent Title: Sampler for taking samples from melts having a melting point higher than 600 ° C. and method for taking samples
- Patent Title (中): 用于从熔点高于600℃的熔体中取样的取样器以及取样的方法
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Application No.: US13464019Application Date: 2012-05-04
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Publication No.: US09128013B2Publication Date: 2015-09-08
- Inventor: Lihuan Song , Gerrit Broekmans , Guido Jacobus Neyens , Dries Beyens
- Applicant: Lihuan Song , Gerrit Broekmans , Guido Jacobus Neyens , Dries Beyens
- Applicant Address: BE Houthalen
- Assignee: Heraeus Electro-Nite International N.V.
- Current Assignee: Heraeus Electro-Nite International N.V.
- Current Assignee Address: BE Houthalen
- Agency: Panitch Schwarze Belisario & Nadel LLP
- Priority: DE102011101943 20110518; DE102011121183 20111216
- Main IPC: G01J3/28
- IPC: G01J3/28 ; G01N1/12 ; G01N33/20

Abstract:
A sampler is provided for taking samples from melts having a melting point higher than 600° C., in particular for metal or cryolite melts. The sampler includes a carrier tube having an immersion end and having a sample chamber assembly arranged on the immersion end of the carrier tube. The assembly has an inlet opening and a sample cavity for the melt and is arranged at least partly inside the carrier tube. The sample chamber assembly has on a part of its outer surface a coupling device, arranged inside the carrier tube, for coupling a carrier lance. A method is also provided for taking samples using such a sampler.
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