Invention Grant
- Patent Title: X-ray analysis apparatus
- Patent Title (中): X射线分析仪
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Application No.: US13648525Application Date: 2012-10-10
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Publication No.: US09128029B2Publication Date: 2015-09-08
- Inventor: Keiichi Morikawa , Hiroki Yoshida
- Applicant: Rigaku Corporation
- Applicant Address: JP Akishima-Shi, Tokyo
- Assignee: RIGAKU CORPORATION
- Current Assignee: RIGAKU CORPORATION
- Current Assignee Address: JP Akishima-Shi, Tokyo
- Agency: Buchanan Ingersoll & Rooney PC
- Priority: JP2011-256218 20111124
- Main IPC: H05G1/64
- IPC: H05G1/64 ; G01N23/20

Abstract:
An X-ray analysis apparatus having a function for enabling a plurality of measurement methods to be implemented, the apparatus having: measurement software for implementing each of the individual measurement methods and acquiring measurement data; analysis software for performing a predetermined analysis on the measurement data and acquiring analysis data; reduced-size-image-creating means for creating a reduced-size image on the basis of each item of the measurement data and the analysis data; analysis-icon-creating means for creating an icon for denoting the analysis software; and image display means for displaying the reduced-size image and the icon on the same screen while indicating that the reduced-size image and the icon are correlated.
Public/Granted literature
- US20130136236A1 X-RAY ANALYSIS APPARATUS Public/Granted day:2013-05-30
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