Invention Grant
- Patent Title: Apparatus and method for inspecting graphene board
- Patent Title (中): 用于检查石墨烯板的装置和方法
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Application No.: US13690051Application Date: 2012-11-30
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Publication No.: US09128050B2Publication Date: 2015-09-08
- Inventor: Dong-kwan Won
- Applicant: SAMSUNG TECHWIN CO., LTD.
- Applicant Address: KR Changwon-si
- Assignee: Hanwha Techwin Co., Ltd.
- Current Assignee: Hanwha Techwin Co., Ltd.
- Current Assignee Address: KR Changwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2012-0036800 20120409; KR10-2012-0086942 20120808
- Main IPC: G01N21/59
- IPC: G01N21/59 ; G01B11/04 ; G01N21/956 ; G01B11/14 ; G01B11/02 ; G01N21/95

Abstract:
An apparatus and method for inspecting a graphene board. The graphene board inspecting apparatus for inspecting a graphene board on which at least one graphene layer is formed includes: a light processing unit which emits at least one light on the graphene board, receives the at least one light penetrating the graphene board and converts the received at least one light to an output signal; a transmittance detecting unit which receives the output signal from the light processing unit to inspect a transmittance of the at least one light penetrating the graphene board; and a determination unit which is connected to the transmittance detecting unit and receives the detected transmittance to determine a state of the graphene board by analyzing the detected transmittance.
Public/Granted literature
- US20130265567A1 APPARATUS AND METHOD FOR INSPECTING GRAPHENE BOARD Public/Granted day:2013-10-10
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