Invention Grant
- Patent Title: Non-contact stress measuring device
- Patent Title (中): 非接触式应力测量装置
-
Application No.: US12953557Application Date: 2010-11-24
-
Publication No.: US09128063B2Publication Date: 2015-09-08
- Inventor: Kevin Allan Dooley
- Applicant: Kevin Allan Dooley
- Applicant Address: CA Longueuil
- Assignee: PRATT & WHITNEY CANADA CORP.
- Current Assignee: PRATT & WHITNEY CANADA CORP.
- Current Assignee Address: CA Longueuil
- Agency: Norton Rose Fulbright Canada LLP
- Main IPC: G01R27/28
- IPC: G01R27/28 ; G01N27/90 ; G01R27/26 ; G01N3/06 ; G01L1/12 ; G01L3/10

Abstract:
Apparatuses and methods for measuring stress or strain in a conductive material without physical contact with the material are provided. The device comprises an inductor circuit configured to induce an alternating current into the material along a first path; and a detector configured to detect a signal representative of the stress in the material along the first path when current is induced in the material.
Public/Granted literature
- US20120126833A1 NON-CONTACT STRESS MEASURING DEVICE Public/Granted day:2012-05-24
Information query