Invention Grant
US09128077B2 Deterioration analysis method and chemical state measurement method 有权
劣化分析方法和化学状态测量方法

Deterioration analysis method and chemical state measurement method
Abstract:
The present invention provides a deterioration analysis method capable of analyzing in detail deterioration of a polymer material, and in particular deterioration in the surface condition of a polymer material with low conductivity. The present invention relates to a deterioration analysis method including irradiating a polymer material with a metal coating having a thickness of 100 Å or less formed thereon, with high intensity X-rays, and measuring X-ray absorption while varying the energy of the X-rays, to analyze deterioration of the polymer.
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