Invention Grant
- Patent Title: Concurrent transformer test system and method
- Patent Title (中): 并联变压器测试系统及方法
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Application No.: US13660816Application Date: 2012-10-25
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Publication No.: US09128134B2Publication Date: 2015-09-08
- Inventor: David Hembree Milner, Jr. , John Leonard Shanks , Harvey Wayne Veselka, Jr.
- Applicant: AVO Multi-Amp Corporation
- Applicant Address: US TX Dallas
- Assignee: AVO Multi-Amp Corporation
- Current Assignee: AVO Multi-Amp Corporation
- Current Assignee Address: US TX Dallas
- Agency: Conley Rose, P.C.
- Agent J. Robert Brown, Jr.
- Main IPC: G01R29/20
- IPC: G01R29/20

Abstract:
A tester for testing a transformer is provided. The tester comprises a primary voltmeter and a plurality of secondary voltmeters. The tester may also comprise an ammeter in series with a voltage source configured to apply voltage to the transformer. The primary voltmeter is configured to measure voltage induced across a primary winding of the transformer, while the secondary voltmeters may simultaneously measure voltage outputs at secondary windings of the transformer. The tester is configured to calculate ratios, saturation curves, and knee points for multiple winding combinations based on the measurements simultaneously obtained by the ammeter and the primary and secondary voltmeters.
Public/Granted literature
- US20140118015A1 Concurrent Transformer Test System and Method Public/Granted day:2014-05-01
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