Invention Grant
- Patent Title: Test head, test board and test apparatus
- Patent Title (中): 测试头,测试板和测试仪器
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Application No.: US13368339Application Date: 2012-02-08
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Publication No.: US09128147B2Publication Date: 2015-09-08
- Inventor: Daisuke Makita , Mitsuru Fukuda , Toru Honobe
- Applicant: Daisuke Makita , Mitsuru Fukuda , Toru Honobe
- Applicant Address: JP Tokyo
- Assignee: ADVANTEST CORPORATION
- Current Assignee: ADVANTEST CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP2010-116617 20100520
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/28 ; H05K7/14

Abstract:
A test board can be inserted to a test head and removed from the test head while the connecting section for mounting thereon devices under test is mounted on the upper portion of the test head. A test head for retaining therein at least one test board for testing devices under test, includes: a casing provided with, on one side surface thereof, an opening through which the at least one test board is inserted and removed, the casing retaining therein the at least one test board with an upper side thereof oriented towards an upper surface of the casing; and a mounting member that guides a lower side of the at least one test board through the opening to a pre-set position, imposes an upward force to the lower side of the at least one test board, thereby mounting the at least one test board to the casing.
Public/Granted literature
- US20120280705A1 TEST HEAD, TEST BOARD AND TEST APPARATUS Public/Granted day:2012-11-08
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