Invention Grant
- Patent Title: Optical probe and optical measuring method
- Patent Title (中): 光学探针和光学测量方法
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Application No.: US14234040Application Date: 2013-03-14
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Publication No.: US09128249B2Publication Date: 2015-09-08
- Inventor: Takemi Hasegawa , Mitsuharu Hirano
- Applicant: Sumitomo Electric Industries, Ltd.
- Applicant Address: JP Osaka-shi
- Assignee: Sumitomo Electric Industries, Ltd.
- Current Assignee: Sumitomo Electric Industries, Ltd.
- Current Assignee Address: JP Osaka-shi
- Agency: Venable LLP
- Agent Michael A. Sartori; F. Brock Riggs
- Priority: JP2012-063984 20120321
- International Application: PCT/JP2013/057139 WO 20130314
- International Announcement: WO2013/141128 WO 20130926
- Main IPC: G01J5/02
- IPC: G01J5/02 ; G02B6/32 ; A61B5/00 ; G01B9/02 ; A61B5/02

Abstract:
An optical measurement method that can suppress variation in detection sensitivity even if an optical probe is bent, and an optical probe suitably used for the method are provided. An optical probe 10 includes an optical fiber 11 that transmits light between a proximal end 11a and a distal end 11b, an optical connector 12 connected with the optical fiber 11 at a side of the proximal end 11a, a focusing optical system 13 and a deflecting optical system 14 optically connected with the optical fiber 11 at a side of the distal end 11b, and a support tube 15 and a jacket tube 16 surrounding the optical fiber 11 and extending along the optical fiber 11. The optical fiber 11 is twisted by a number of turns in a range from one turn/m to 50 turns per meter around an axis of the optical fiber as the center and fixed relative to the support tube 15.
Public/Granted literature
- US20140158888A1 OPTICAL PROBE AND OPTICAL MEASURING METHOD Public/Granted day:2014-06-12
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