Invention Grant
- Patent Title: On-chip bad block management for NAND flash memory
- Patent Title (中): 用于NAND闪存的片上坏块管理
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Application No.: US13530518Application Date: 2012-06-22
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Publication No.: US09128822B2Publication Date: 2015-09-08
- Inventor: Oron Michael , Robin John Jigour , Anil Gupta
- Applicant: Oron Michael , Robin John Jigour , Anil Gupta
- Applicant Address: TW Taichung
- Assignee: WINBOND ELECTRONICS CORPORATION
- Current Assignee: WINBOND ELECTRONICS CORPORATION
- Current Assignee Address: TW Taichung
- Agent David H. Carroll
- Main IPC: G06F12/02
- IPC: G06F12/02 ; G06F3/06

Abstract:
Certain functions relating to creation and use of a look-up table for bad block mapping may be implemented “on chip” in the memory device itself, that is on the same die in an additional circuit, or even within the command and control logic of the memory device, so as to reduce the overhead. Moreover, the on-chip implementation of the look-up table may be tightly integrated with other functions of the command and control logic to enable powerful new commands for NAND flash memory, such as a continuous read command and variations thereof.
Public/Granted literature
- US20130346671A1 On-Chip Bad Block Management for NAND Flash Memory Public/Granted day:2013-12-26
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