Invention Grant
US09129358B2 Inspecting apparatus, robot apparatus, inspecting method, and inspecting program
有权
检查仪器,机器人装置,检查方法和检查程序
- Patent Title: Inspecting apparatus, robot apparatus, inspecting method, and inspecting program
- Patent Title (中): 检查仪器,机器人装置,检查方法和检查程序
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Application No.: US13753794Application Date: 2013-01-30
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Publication No.: US09129358B2Publication Date: 2015-09-08
- Inventor: Takashi Nammoto , Koichi Hashimoto , Tomohiro Inoue
- Applicant: Seiko Epson Corporation
- Applicant Address: JP
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP2012-020145 20120201
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00

Abstract:
An inspecting apparatus includes an image pickup unit configured to pick up a plurality of images of an inspection target object with different exposure times and generate, image data of an inspection target object image including an inspection region, a weighted-image-data generating unit configured to weight, for each of the image data generated with the exposure times different from one another, data of pixels indicating a region where a difference in gradation of pixel values is relatively large among regions of pixels included in the image data and generate weighted image data, an image-data combining unit configured to generate combined image data obtained by combining the generated respective weighted image data, and a determining unit configured to determine a state of the inspection region on the basis of image data of a reference image set and the generated combined image data.
Public/Granted literature
- US20130195345A1 INSPECTING APPARATUS, ROBOT APPARATUS, INSPECTING METHOD, AND INSPECTING PROGRAM Public/Granted day:2013-08-01
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