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US09129710B1 Dynamic trim method for non volatile memory products 有权
非易失性存储器产品的动态修剪方法

Dynamic trim method for non volatile memory products
Abstract:
A dynamic trim method includes testing a selected number of cells on a die with predetermined testing margins. Data from this testing is used to determine dynamic reference margins for improving yield. Advantageously, yield is improved by allowing functioning fast or slow units to pass wafer sort by applying the dynamic reference margins for varying processes.
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