Invention Grant
- Patent Title: Dynamic trim method for non volatile memory products
- Patent Title (中): 非易失性存储器产品的动态修剪方法
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Application No.: US14153161Application Date: 2014-01-13
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Publication No.: US09129710B1Publication Date: 2015-09-08
- Inventor: Yi He , Larry Y. Wang , Sean Lynch , Che-Ping Chen , Wei Zhao , Albert Bergemont
- Applicant: Maxim Integrated Products, Inc.
- Applicant Address: US CA San Jose
- Assignee: Maxim Integrated Products, Inc.
- Current Assignee: Maxim Integrated Products, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Advent, LLP
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
A dynamic trim method includes testing a selected number of cells on a die with predetermined testing margins. Data from this testing is used to determine dynamic reference margins for improving yield. Advantageously, yield is improved by allowing functioning fast or slow units to pass wafer sort by applying the dynamic reference margins for varying processes.
Public/Granted literature
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