Invention Grant
- Patent Title: Manufacturing method for a semiconductor on insulator type substrate for radiofrequency applications
- Patent Title (中): 用于射频应用的半导体绝缘体型衬底的制造方法
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Application No.: US14006378Application Date: 2012-03-22
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Publication No.: US09129800B2Publication Date: 2015-09-08
- Inventor: Frédéric Allibert , Julie Widiez
- Applicant: Frédéric Allibert , Julie Widiez
- Applicant Address: FR Bernin FR Paris
- Assignee: Soitec,Commissariat A L'Energie Atomique et aux Energies Alternatives
- Current Assignee: Soitec,Commissariat A L'Energie Atomique et aux Energies Alternatives
- Current Assignee Address: FR Bernin FR Paris
- Agency: TraskBritt
- Priority: FR1152355 20110322
- International Application: PCT/EP2012/055133 WO 20120322
- International Announcement: WO2012/127006 WO 20120927
- Main IPC: H01L29/04
- IPC: H01L29/04 ; H01L29/06 ; H01L21/02 ; H01L21/762

Abstract:
The invention relates to a method for manufacturing a semiconductor on insulator type substrate for radio frequency applications, comprising the following steps in sequence: (a) provision of a silicon substrate with an electrical resistivity of more than 500 Ohm.cm, (b) formation of a polycrystalline silicon layer on the substrate, the method comprising a step between steps a) and b) to form a dielectric material layer, different from a native oxide layer, on the substrate, between 0.5 and 10 nm thick.
Public/Granted literature
- US20140084290A1 MANUFACTURING METHOD FOR A SEMICONDUCTOR ON INSULATOR TYPE SUBSTRATE FOR RADIOFREQUENCY APPLICATIONS Public/Granted day:2014-03-27
Information query
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