Invention Grant
- Patent Title: Imaging pixels with improved photodiode structures
- Patent Title (中): 具有改进的光电二极管结构的成像像素
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Application No.: US14031691Application Date: 2013-09-19
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Publication No.: US09129872B2Publication Date: 2015-09-08
- Inventor: Xianmin Yi , Paul Perez
- Applicant: Semiconductor Components Industries, LLC
- Applicant Address: US AZ Phoenix
- Assignee: Semiconductor Components Industries, LLC
- Current Assignee: Semiconductor Components Industries, LLC
- Current Assignee Address: US AZ Phoenix
- Agency: Treyz Law Group
- Agent Kendall P. Woodruff
- Main IPC: H01L27/146
- IPC: H01L27/146 ; H01L31/0352

Abstract:
A photodiodes may be formed on a substrate such as an imager substrate. The photodiode may include first and second layers in the substrate that form a p-n junction. The first layer may have a first doping type such as p-type doping, whereas the second layer may have a second, opposite doping type such as n-type doping. A counter-doping implant region may be provided that only partially overlaps with the second layer of the photodiode. The counter-doping implant region may have an opposite doping type to the second layer and may have a dopant concentration that is less than the dopant concentration of the second layer. The counter-doping implant region may extend into a third layer of the substrate that may have the same doping type of the second layer but at a lower concentration than the counter-doping implant region.
Public/Granted literature
- US20140077325A1 IMAGING PIXELS WITH IMPROVED PHOTODIODE STRUCTURES Public/Granted day:2014-03-20
Information query
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