Invention Grant
US09129996B2 Non-volatile memory (NVM) cell and high-K and metal gate transistor integration
有权
非易失性存储器(NVM)单元和高K和金属栅极晶体管集成
- Patent Title: Non-volatile memory (NVM) cell and high-K and metal gate transistor integration
- Patent Title (中): 非易失性存储器(NVM)单元和高K和金属栅极晶体管集成
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Application No.: US14023440Application Date: 2013-09-10
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Publication No.: US09129996B2Publication Date: 2015-09-08
- Inventor: Frank K. Baker, Jr. , Cheong Min Hong
- Applicant: Frank K. Baker, Jr. , Cheong Min Hong
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L21/28 ; H01L27/115

Abstract:
A method of making a semiconductor device includes depositing a layer of polysilicon in a non-volatile memory (NVM) region and a logic region of a substrate. The layer of polysilicon is patterned into a gate in the NVM region while the layer of polysilicon remains in the logic region. A memory cell is formed including the gate in the NVM region while the layer of polysilicon remains in the logic region. The layer of polysilicon in the logic region is removed and the substrate is implanted to form a well region in the logic region after the memory cell is formed. A layer of gate material is deposited in the logic region. The layer of gate material is patterned into a logic gate in the logic region.
Public/Granted literature
- US20150072489A1 NON-VOLATILE MEMORY (NVM) CELL AND HIGH-K AND METAL GATE TRANSISTOR INTEGRATION Public/Granted day:2015-03-12
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