Invention Grant
- Patent Title: Image inspection apparatus to detect a defect in a read image
- Patent Title (中): 用于检测读取图像中的缺陷的图像检查装置
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Application No.: US14174419Application Date: 2014-02-06
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Publication No.: US09131187B2Publication Date: 2015-09-08
- Inventor: Takako Shijoh
- Applicant: Takako Shijoh
- Applicant Address: JP Tokyo
- Assignee: Ricoh Company, Ltd.
- Current Assignee: Ricoh Company, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2013-024688 20130212; JP2014-019199 20140204
- Main IPC: G06K15/00
- IPC: G06K15/00 ; H04N1/44 ; G06K9/00

Abstract:
An image inspection apparatus is provided for inspecting an image output on a recording medium by scanning the output image. The image inspection apparatus includes an inspection reference image generator to obtain an output-target image print data, and to generate an inspection reference image using the output-target image print data, an inspection result acquisition unit to acquire a result of a defect determination based on a difference between the generated inspection reference image and the read image, a restriction-on-disclosure process unit to change, based on restriction-on-disclosure positional information, which indicates a restricted area in the read image that should be restricted when displayed, a value of a pixel in the restricted area, when a defect is detected in the read image, to generate a corrected image, and an information transmission unit to transmit the corrected image through a network.
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