Invention Grant
- Patent Title: Capacitance difference detecting circuit
- Patent Title (中): 电容差检测电路
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Application No.: US13561076Application Date: 2012-07-29
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Publication No.: US09136841B2Publication Date: 2015-09-15
- Inventor: Kun-Chih Lin , Wen-Chi Wu
- Applicant: Kun-Chih Lin , Wen-Chi Wu
- Applicant Address: TW Jhubei, Hsinchu County
- Assignee: ILI TECHNOLOGY CORP.
- Current Assignee: ILI TECHNOLOGY CORP.
- Current Assignee Address: TW Jhubei, Hsinchu County
- Agent Winston Hsu; Scott Margo
- Priority: TW098138950A 20091117
- Main IPC: G01R27/26
- IPC: G01R27/26 ; H03K17/96 ; G01D5/24

Abstract:
A capacitance difference detecting circuit with a control circuit, a first capacitor, a second capacitor, a voltage control unit and a computing device. The control circuit generates a control signal according to a first voltage and a second voltage. The voltage control unit cooperates with the first capacitor to be detected and the second capacitor to be detected, according to the control signal, to generate the first voltage and the second voltage. The computing device computes a capacitance difference between the first capacitor to be detected and the second capacitor to be detected according to the first voltage, the second voltage and a parameter of the voltage control unit.
Public/Granted literature
- US20120286812A1 CAPACITANCE DIFFERENCE DETECTING CIRCUIT Public/Granted day:2012-11-15
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