Invention Grant
US09137066B2 Method and apparatus for generating a metric for use in one or more of lock detection, SNR estimation, and modulation classification 有权
用于生成用于锁定检测,SNR估计和调制分类中的一个或多个的度量的方法和装置

  • Patent Title: Method and apparatus for generating a metric for use in one or more of lock detection, SNR estimation, and modulation classification
  • Patent Title (中): 用于生成用于锁定检测,SNR估计和调制分类中的一个或多个的度量的方法和装置
  • Application No.: US13882780
    Application Date: 2011-11-01
  • Publication No.: US09137066B2
    Publication Date: 2015-09-15
  • Inventor: Yair Linn
  • Applicant: Yair Linn
  • Agency: McCormick, Paulding & Huber LLP
  • International Application: PCT/CA2011/001220 WO 20111101
  • International Announcement: WO2012/058759 WO 20120510
  • Main IPC: H04L27/00
  • IPC: H04L27/00 H04L27/20 H04L27/38 H03J7/06 H03D13/00 H04B17/00 H04B17/391
Method and apparatus for generating a metric for use in one or more of lock detection, SNR estimation, and modulation classification
Abstract:
The present disclosure is directed at a method and apparatus for generating a metric for use in any one or more of lock detection, SNR estimation, and modulation classification. To generate the metric, an input angle in the form of a symbol phase or a difference in symbol phases is used to evaluate a base function. The base function relates possible metrics to possible input angles using a triangle wave having its maxima or minima at ideal input angles, and the other of its maxima or minima at angles midway the ideal input angles. Described are embodiments that are one or more of non-data aided; that may be implemented relatively efficiently in hardware; that can function using one sample/symbol; that can achieve relatively good detection certainty using relatively few estimates; and that can be used to implement modulation classifiers, lock detectors, and SNR estimators that are resilient to imperfections in automatic gain control.
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