Invention Grant
- Patent Title: System and method for interrogation of target material in situ
- Patent Title (中): 目的材料原位询问系统和方法
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Application No.: US13444116Application Date: 2012-04-11
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Publication No.: US09140643B2Publication Date: 2015-09-22
- Inventor: Jerome Anthony Bellian , Christopher Michael Tolleson
- Applicant: Jerome Anthony Bellian , Christopher Michael Tolleson
- Applicant Address: US CA San Ramon
- Assignee: CHEVRON U.S.A. INC.
- Current Assignee: CHEVRON U.S.A. INC.
- Current Assignee Address: US CA San Ramon
- Agent Albert K. Shung
- Main IPC: G01J3/28
- IPC: G01J3/28 ; G01N21/27 ; G01N21/55 ; G01J3/26 ; G01S17/89 ; G01S7/48 ; G01V8/02 ; G01J3/02 ; G01N21/31

Abstract:
A system for remotely sensing a target material in situ include a broad-band laser source, at least one tunable filter coupled to the source laser for generating a swept-frequency signal an optical device for splitting the swept-frequency signal into a first illumination signal and second illumination signal, a first optical path for directing the first illumination signal unto the target material and receiving a reflected signal from the target material, a second optical path for receiving the second illumination signal and generating a spectral reference signal, and a controller coupled to the first optical path and the second optical path for adjusting the frequency and spatial resolution of the laser source based at least in part on a comparison of the spectral reference signal and the reflected signal.
Public/Granted literature
- US20130271752A1 SYSTEM AND METHOD FOR INTERROGATION OF TARGET MATERIAL IN SITU Public/Granted day:2013-10-17
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