Invention Grant
- Patent Title: Method for producing semiconductor device
- Patent Title (中): 半导体器件的制造方法
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Application No.: US14090424Application Date: 2013-11-26
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Publication No.: US09142411B2Publication Date: 2015-09-22
- Inventor: Masatoshi Tsujimura , Hirokazu Fujiwara , Tomoo Morino , Narumasa Soejima
- Applicant: Masatoshi Tsujimura , Hirokazu Fujiwara , Tomoo Morino , Narumasa Soejima
- Applicant Address: JP Toyota-Shi
- Assignee: Toyota Jidosha Kabushiki Kaisha
- Current Assignee: Toyota Jidosha Kabushiki Kaisha
- Current Assignee Address: JP Toyota-Shi
- Agency: Kenyon & Kenyon LLP
- Priority: JP2012-263471 20121130
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/04 ; H01L21/673 ; H01L29/16

Abstract:
A method for producing a semiconductor device includes: an arranging process of arranging a plurality of silicon carbide wafers having opposed first and surfaces so that the first surface and the second surface of adjacent silicon carbide wafers face each other and are separated in parallel; and a heat treatment process of heating the arranged plurality of silicon carbide wafers so that the first surface of each silicon carbide wafer becomes higher in temperature than the second surface thereof, and, in the adjacent silicon carbide wafers, the second surface of one silicon carbide wafer becomes higher in temperature than the first surface of the other silicon carbide wafer that faces the second surface.
Public/Granted literature
- US20140162443A1 METHOD FOR PRODUCING SEMICONDUCTOR DEVICE Public/Granted day:2014-06-12
Information query
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