Invention Grant
- Patent Title: Semiconductor component with a semiconductor via
- Patent Title (中): 具有半导体通孔的半导体元件
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Application No.: US12964865Application Date: 2010-12-10
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Publication No.: US09142665B2Publication Date: 2015-09-22
- Inventor: Franz Hirler , Andreas Peter Meiser
- Applicant: Franz Hirler , Andreas Peter Meiser
- Applicant Address: AT Villach
- Assignee: Infineon Technologies Austria AG
- Current Assignee: Infineon Technologies Austria AG
- Current Assignee Address: AT Villach
- Agency: Murphy, Bilak & Homiller, PLLC
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L29/78 ; H01L21/768 ; H01L21/8234 ; H01L23/48 ; H01L23/00 ; H01L27/088 ; H01L29/06 ; H01L29/423 ; H01L29/739

Abstract:
A method for producing a semiconductor component includes providing a semiconductor body with a first surface and a second surface opposite the first surface, forming an insulation trench which extends into the semiconductor body from the first surface and which in a horizontal plane of the semiconductor body has a geometry such that the insulation trench defines a via region of the semiconductor body, forming a first insulation layer on one or more sidewalls of the insulation trench, removing semiconductor material of the semiconductor body from the second surface to expose at least parts of the first insulation layer, to remove at least parts of the first insulation layer, or to leave at least partially a semiconductor layer with a thickness of less than 1 μm between the first insulation layer and the second surface, and forming first and second contact electrodes on the via region.
Public/Granted literature
- US20120146130A1 SEMICONDUCTOR COMPONENT WITH A SEMICONDUCTOR VIA Public/Granted day:2012-06-14
Information query
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