Invention Grant
- Patent Title: Testing structure, method and system for testing shutter glasses
- Patent Title (中): 测试快门眼镜的测试结构,方法和系统
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Application No.: US13526172Application Date: 2012-06-18
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Publication No.: US09148655B2Publication Date: 2015-09-29
- Inventor: Chih-Li Wang , Ming-Jen Chan , Yi-Cheng Lee
- Applicant: Chih-Li Wang , Ming-Jen Chan , Yi-Cheng Lee
- Applicant Address: TW New Taipei
- Assignee: Wistron Corp.
- Current Assignee: Wistron Corp.
- Current Assignee Address: TW New Taipei
- Priority: TW100123622A 20110705
- Main IPC: H04N13/02
- IPC: H04N13/02 ; H04N13/04 ; H04N17/04

Abstract:
A testing system including a preset display device, preset shutter glasses and a testing device is disclosed. The preset display device generates a synchronization signal and outputs a timing signal relating to the synchronization signal. The preset shutter glasses receive the synchronization signal to generate a masking signal. The testing device processes the timing signal and the masking signal according to a setting signal and determines whether the preset shutter glasses are normal according to the processed result.
Public/Granted literature
- US20130010090A1 TESTING STRUCTURE, METHOD AND SYSTEM FOR TESTING SHUTTER GLASSES Public/Granted day:2013-01-10
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