Invention Grant
- Patent Title: Communication quality measuring apparatus and communication quality measuring method
- Patent Title (中): 通信质量测量仪器和通信质量测量方法
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Application No.: US13971367Application Date: 2013-08-20
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Publication No.: US09148813B2Publication Date: 2015-09-29
- Inventor: Yuki Shinada , Hiromitsu Kawai
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2012-250678 20121114
- Main IPC: H04W24/00
- IPC: H04W24/00 ; H04W24/10 ; H04W24/08 ; H04W64/00

Abstract:
A communication quality measuring apparatus includes a calculating unit, a specifying unit, and an associating unit. The calculating unit collects information that is used to calculate the communication quality of wireless communication from a base station that performs wireless communication with a mobile station and calculates the communication quality by using the information. The specifying unit collects location information from a measuring device that measures the location information related to the mobile station and specifies a mobile station area that is an area in which the mobile station is located by using the location information. The associating unit associates the communication quality calculated by the calculating unit with each of the mobile station areas specified by the specifying unit.
Public/Granted literature
- US20140135043A1 COMMUNICATION QUALITY MEASURING APPARATUS AND COMMUNICATION QUALITY MEASURING METHOD Public/Granted day:2014-05-15
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