Invention Grant
- Patent Title: Defect emulation system
- Patent Title (中): 缺陷仿真系统
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Application No.: US11895399Application Date: 2007-08-24
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Publication No.: US09153270B1Publication Date: 2015-10-06
- Inventor: Zining Wu , Shaohua Yang
- Applicant: Zining Wu , Shaohua Yang
- Applicant Address: BM Hamilton
- Assignee: Marvell International Ltd.
- Current Assignee: Marvell International Ltd.
- Current Assignee Address: BM Hamilton
- Main IPC: G11B20/18
- IPC: G11B20/18 ; G11B7/0037 ; G11B7/26

Abstract:
A defect emulator module for a rotating storage device includes a coefficient module that generates a first coefficient. A location module generates a location. A defect signal module selectively modifies a read-back signal based on the first coefficient and the location. The first coefficient includes an emulation of a first defect in the read-back signal.
Information query
IPC分类: