Invention Grant
US09153404B2 Charged particle beam scanning using deformed high gradient insulator
有权
使用变形高梯度绝缘子的带电粒子束扫描
- Patent Title: Charged particle beam scanning using deformed high gradient insulator
- Patent Title (中): 使用变形高梯度绝缘子的带电粒子束扫描
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Application No.: US13705084Application Date: 2012-12-04
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Publication No.: US09153404B2Publication Date: 2015-10-06
- Inventor: Yu-Jiuan Chen
- Applicant: Lawrence Livermore National Security, LLC
- Applicant Address: US CA Livermore
- Assignee: Lawrence Livermore National Security, LLC
- Current Assignee: Lawrence Livermore National Security, LLC
- Current Assignee Address: US CA Livermore
- Agency: Perkins Coie LLP
- Main IPC: H01J3/26
- IPC: H01J3/26 ; A61N5/10 ; G21K1/087

Abstract:
Devices and methods are provided to allow rapid deflection of a charged particle beam. The disclosed devices can, for example, be used as part of a hadron therapy system to allow scanning of a target area within a patient's body. The disclosed charged particle beam deflectors include a dielectric wall accelerator (DWA) with a hollow center and a dielectric wall that is substantially parallel to a z-axis that runs through the hollow center. The dielectric wall includes one or more deformed high gradient insulators (HGIs) that are configured to produce an electric field with an component in a direction perpendicular to the z-axis. A control component is also provided to establish the electric field component in the direction perpendicular to the z-axis and to control deflection of a charged particle beam in the direction perpendicular to the z-axis as the charged particle beam travels through the hollow center of the DWA.
Public/Granted literature
- US20130140468A1 CHARGED PARTICLE BEAM SCANNING USING DEFORMED HIGH GRADIENT INSULATOR Public/Granted day:2013-06-06
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