Invention Grant
- Patent Title: Methods of processing substrates and methods of forming conductive connections to substrates
- Patent Title (中): 处理衬底的方法和形成与衬底的导电连接的方法
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Application No.: US14258885Application Date: 2014-04-22
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Publication No.: US09153485B2Publication Date: 2015-10-06
- Inventor: Nishant Sinha , Gurtej S. Sandhu
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Wells St. John P.S.
- Main IPC: C23F3/00
- IPC: C23F3/00 ; H01L21/768

Abstract:
Embodiments disclosed include methods of processing substrates, including methods of forming conductive connections to substrates. In one embodiment, a method of processing a substrate includes forming a material to be etched over a first material of a substrate. The material to be etched and the first material are of different compositions. The material to be etched is etched in a dry etch chamber to expose the first material. After the etching, the first material is contacted with a non-oxygen-containing gas in situ within the dry etch chamber effective to form a second material physically contacting onto the first material. The second material comprises a component of the first material and a component of the gas. In one embodiment, the first material is contacted with a gas that may or may not include oxygen in situ within the dry etch chamber effective to form a conductive second material.
Public/Granted literature
- US20140248769A1 Methods of Processing Substrates and Methods of Forming Conductive Connections to Substrates Public/Granted day:2014-09-04
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