Invention Grant
US09155155B1 Overlapping measurement sequences for interference-resistant compensation in light emitting diode devices 有权
用于发光二极管器件中抗干扰补偿的重叠测量序列

  • Patent Title: Overlapping measurement sequences for interference-resistant compensation in light emitting diode devices
  • Patent Title (中): 用于发光二极管器件中抗干扰补偿的重叠测量序列
  • Application No.: US14510212
    Application Date: 2014-10-09
  • Publication No.: US09155155B1
    Publication Date: 2015-10-06
  • Inventor: Horace C. HoRebecca Frank
  • Applicant: Ketra, Inc.
  • Applicant Address: US TX Austin
  • Assignee: Ketra, Inc.
  • Current Assignee: Ketra, Inc.
  • Current Assignee Address: US TX Austin
  • Agency: Daffer McDaniel LLP
  • Agent Kevin L. Daffer
  • Main IPC: H05B37/02
  • IPC: H05B37/02 H05B33/08
Overlapping measurement sequences for interference-resistant compensation in light emitting diode devices
Abstract:
A method and illumination device are provided for interference-resistant compensation in light emitting diode (LED) devices. In one embodiment, the method includes initiating a sequence of measurements during multiple measurement intervals interspersed with periods of illumination. The sequence of measurements includes sensitive measurements performed during measurement intervals when a non-constant external illumination is not present, and at least one non-sensitive measurement performed during an interval when non-constant external illumination is present. An embodiment of an illumination device comprising a lamp includes multiple emission LED elements, one or more photodetectors, a storage medium adapted for storing configuration information, and a lamp control circuit. The configuration information includes ordering of sensitive and non-sensitive measurements within a sequence of compensation measurements that the lamp is configured to perform, and ordering of interfering and non-interfering measurements within an additional sequence of measurements that an additional lamp is configured to perform.
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