Invention Grant
US09159441B2 Method of operating memory device assuring reliability and memory system
有权
操作存储设备的方法确保可靠性和存储系统
- Patent Title: Method of operating memory device assuring reliability and memory system
- Patent Title (中): 操作存储设备的方法确保可靠性和存储系统
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Application No.: US14446349Application Date: 2014-07-30
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Publication No.: US09159441B2Publication Date: 2015-10-13
- Inventor: Jun Hee Kim , Hyun Sik Yun , Youn Won Park , Hee Tai Oh
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2013-0121578 20131011
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/26

Abstract:
A method of operating a memory device to guarantee program reliability and a memory system using the same are provided. The method includes backing up data stored in the memory cells connected to a first word line, performing a dummy program operation on memory cells connected to a second word line adjacent to the first word line, and performing a recharge program operation on the memory cells connected to the first word line.
Public/Granted literature
- US20150103599A1 METHOD OF OPERATING MEMORY DEVICE ASSURING RELIABILITY AND MEMORY SYSTEM Public/Granted day:2015-04-16
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