Invention Grant
US09159454B2 Failure detection apparatus for solid state drive tester 有权
固态驱动测试仪故障检测装置

  • Patent Title: Failure detection apparatus for solid state drive tester
  • Patent Title (中): 固态驱动测试仪故障检测装置
  • Application No.: US13921918
    Application Date: 2013-06-19
  • Publication No.: US09159454B2
    Publication Date: 2015-10-13
  • Inventor: Eui Won Lee
  • Applicant: UNITEST INC
  • Applicant Address: KR Yongin-si, Gyeonggi-do
  • Assignee: UNITEST INC
  • Current Assignee: UNITEST INC
  • Current Assignee Address: KR Yongin-si, Gyeonggi-do
  • Agency: Novick, Kim & Lee, PLLC
  • Agent Jae Youn Kim
  • Priority: KR10-2012-0088326 20120813
  • Main IPC: G11C29/00
  • IPC: G11C29/00 G11C29/10 G06F11/22
Failure detection apparatus for solid state drive tester
Abstract:
A failure detection apparatus for a solid state driver tester is provided. The failure detection apparatus includes a host terminal for receiving a test condition for testing a storage from a user and a test control unit for creating a test pattern according to the test condition or creating a test pattern at random, and adaptively selects an interface according to a type of the storage to be tested to test the storage with the test pattern. The test control unit includes a plurality of buffer memories for storing readout data of the storage, stores the readout data in the buffer memories in an interleaving manner, and endows comparison of the created test pattern and the readout data stored in the buffer memories with continuity to test the storage in real time.
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