Invention Grant
- Patent Title: Method and apparatus for MRAM sense reference trimming
- Patent Title (中): 用于MRAM检测参考修整的方法和装置
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Application No.: US13804773Application Date: 2013-03-14
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Publication No.: US09165629B2Publication Date: 2015-10-20
- Inventor: Yue-Der Chih , Kai-Chun Lin , Hung-Chang Yu
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Duane Morris LLP
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C11/16 ; G11C7/14 ; G11C29/02

Abstract:
A trimming process for setting a reference current used in operating an MRAM module comprising an operational MRAM cell coupled to a bit line, multiple reference MRAM cells coupled to a reference bit line, and a sense amplifier coupled to the bit line and the reference bit line is disclosed in some embodiments. The process includes applying a bit line reference voltage to the reference bit line to provide a reference cell current formed by a sum of respective currents through the plurality of reference MRAM cells. The reference cell current is detected. A determination is made as to whether the detected reference cell current differs from a target reference cell current. The bit line reference voltage is varied, or a sensing ratio of the sense amplifier is varied, if it is determined that the detected reference cell current differs from the target reference cell current.
Public/Granted literature
- US20140269030A1 METHOD AND APPARATUS FOR MRAM SENSE REFERENCE TRIMMING Public/Granted day:2014-09-18
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