Invention Grant
- Patent Title: Disturb verify for programming memory cells
- Patent Title (中): 对编程存储单元进行干扰验证
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Application No.: US14164307Application Date: 2014-01-27
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Publication No.: US09165658B2Publication Date: 2015-10-20
- Inventor: Karthik Sarpatwari , Akira Goda
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/10 ; G11C16/04 ; G11C16/34

Abstract:
Apparatuses and methods for disturb verify for programming operations are described. Programming memory cells can include applying a number of programming pulses to a first memory cell, performing a disturb verify operation on a second memory cell adjacent to the first memory cell, and inhibiting the first memory cell from further programming in response to the second memory cell failing the disturb verify operation. Other apparatuses and methods are also disclosed.
Public/Granted literature
- US20140198579A1 DISTURB VERIFY FOR PROGRAMMING MEMORY CELLS Public/Granted day:2014-07-17
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