Invention Grant
- Patent Title: Pulsed gas plasma doping method and apparatus
- Patent Title (中): 脉冲气体等离子体掺杂方法和装置
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Application No.: US14244481Application Date: 2014-04-03
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Publication No.: US09165771B2Publication Date: 2015-10-20
- Inventor: Peter Ventzek , Takenao Nemoto , Hirokazu Ueda , Yuuki Kobayashi , Masahiro Horigome
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Rothwell, Figg, Ernst & Manbeck, P.C.
- Main IPC: H01L21/223
- IPC: H01L21/223 ; H01J37/32 ; H01L21/265 ; H01L21/66 ; H01L29/66

Abstract:
A method and apparatus for doping a surface of a substrate with a dopant, with the dopant being for example phosphine or arsine. The doping is performed with a plasma formed primarily of an inert gas such as helium or argon, with a low concentration of the dopant. To provide conformal doping, preferably to form a monolayer of the dopant, the gas flow introduction location is switched during the doping process, with the gas mixture primarily introduced through a center top port in the process chamber during a first period of time followed by introduction of the gas mixture primarily through peripheral or edge injection ports for a second period of time, with the switching continuing in an alternating fashion as the plasma process.
Public/Granted literature
- US20140302666A1 PULSED GAS PLASMA DOPING METHOD AND APPARATUS Public/Granted day:2014-10-09
Information query
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