Disclosed is a solid state drive tester which reduces the size of the tester and easily changes a function without changing hardware (H/W) by implementing a plurality of devices for testing an SSD as one chip using a Field Programmable Gate Array (FPGA). The solid state drive tester includes: a host terminal receiving a test condition for testing a storage from a user; and a test control unit generating a test pattern corresponding to the test condition, adaptively selecting an interface according to an interface type of the storage to be tested to test the storage using the test pattern, and storing fail data generated during the test in an internal memory. The test control unit is implemented by an FPGA to reduce the size of the tester and easily change a function without hardware.