Invention Grant
US09172951B2 Test circuit for testing signal receiving unit, image pickup apparatus, method of testing signal receiving unit, and method of testing image pickup apparatus
有权
用于测试信号接收单元的测试电路，图像拾取装置，测试信号接收单元的方法以及测试图像拾取装置的方法
- Patent Title: Test circuit for testing signal receiving unit, image pickup apparatus, method of testing signal receiving unit, and method of testing image pickup apparatus
- Patent Title (中): 用于测试信号接收单元的测试电路，图像拾取装置，测试信号接收单元的方法以及测试图像拾取装置的方法
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Application No.: US14553895Application Date: 2014-11-25
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Publication No.: US09172951B2Publication Date: 2015-10-27
- Inventor: Akira Okita , Masaaki Iwane , Yu Arishima , Masaaki Minowa
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: CANON KABUSHIKI KAISHA
- Current Assignee: CANON KABUSHIKI KAISHA
- Current Assignee Address: JP Tokyo
- Agency: Canon USA, Inc. IP Division
- Priority: JP2011-051692 20110309
- Main IPC: H01L27/142
- IPC: H01L27/142 ; H04N17/00 ; H01L27/06 ; H04N5/374 ; H04N5/378 ; H04N5/369 ; H01L29/10 ; H01L27/148 ; H01L27/12 ; H01L27/146 ; H01L27/00
Abstract:
It is disclosed that, as an embodiment, a test circuit includes a test signal supply unit configured to supply a test signal via a signal line to signal receiving units provided in a plurality of columns, wherein the test signal supply unit is a voltage buffer or a current buffer, and the test circuit has a plurality of test signal supply units and a plurality of signal lines, and wherein at least one test signal supply unit is electrically connected to one signal line different from a signal line to which another test signal supply unit is electrically connected.
Public/Granted literature
Information query
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