Invention Grant
- Patent Title: Devices and methods for analyzing spatter generating events
- Patent Title (中): 用于分析飞溅生成事件的设备和方法
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Application No.: US13436673Application Date: 2012-03-30
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Publication No.: US09174294B2Publication Date: 2015-11-03
- Inventor: Richard Martin Hutchison , Todd Earl Holverson , James Lee Uecker
- Applicant: Richard Martin Hutchison , Todd Earl Holverson , James Lee Uecker
- Applicant Address: US IL Glenview
- Assignee: ILLINOIS TOOL WORKS INC.
- Current Assignee: ILLINOIS TOOL WORKS INC.
- Current Assignee Address: US IL Glenview
- Agency: Fletcher Yoder P.C.
- Main IPC: B23K9/095
- IPC: B23K9/095 ; B23K31/12
Abstract:
A method for monitoring a spatter generating event during a welding application. The method includes capturing data that corresponds to a welding current of the welding application. The method also includes detecting parameters associated with a short circuit from the captured data. The method includes analyzing the detected parameters to monitor the spatter generating event during the welding application.
Public/Granted literature
- US20130262000A1 DEVICES AND METHODS FOR ANALYZING SPATTER GENERATING EVENTS Public/Granted day:2013-10-03
Information query
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