Invention Grant
US09175946B2 Measuring method of hole diameter, hole position, hole surface roughness, or bending loss of holey optical fiber, manufacturing method of holey optical fiber, and test method of optical line of holey optical fiber
有权
多孔光纤的孔径，孔位置，孔表面粗糙度或弯曲损耗的测量方法，多孔光纤的制造方法以及多孔光纤的光学线路的测试方法
- Patent Title: Measuring method of hole diameter, hole position, hole surface roughness, or bending loss of holey optical fiber, manufacturing method of holey optical fiber, and test method of optical line of holey optical fiber
- Patent Title (中): 多孔光纤的孔径，孔位置，孔表面粗糙度或弯曲损耗的测量方法，多孔光纤的制造方法以及多孔光纤的光学线路的测试方法
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Application No.: US13213328Application Date: 2011-08-19
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Publication No.: US09175946B2Publication Date: 2015-11-03
- Inventor: Itaru Ishida , Shoji Tanigawa , Shoichiro Matsuo , Toshio Kurashima , Kazuhide Nakajima , Tomoya Shimizu , Takashi Matsui , Yukihiro Goto
- Applicant: Itaru Ishida , Shoji Tanigawa , Shoichiro Matsuo , Toshio Kurashima , Kazuhide Nakajima , Tomoya Shimizu , Takashi Matsui , Yukihiro Goto
- Applicant Address: JP Tokyo JP Tokyo
- Assignee: NIPPON TELEGRAPH AND TELEPHONE CORPORATION,FUJIKURA LTD.
- Current Assignee: NIPPON TELEGRAPH AND TELEPHONE CORPORATION,FUJIKURA LTD.
- Current Assignee Address: JP Tokyo JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2010-185319 20100820; JP2011-021886 20110203
- Main IPC: G01N21/00
- IPC: G01N21/00 ; H04B17/00 ; G01B11/08 ; G01N21/958 ; G01N21/954 ; G01B11/24 ; G01B11/30
Abstract:
A measuring method of a hole diameter of a holey optical fiber includes calculating an arithmetical mean value I(x) from two backscattering light intensities at a position x of two backscattering light waveforms of the holey optical fiber, in which the two backscattering light waveforms are obtained by OTDR measurement; and obtaining the hole diameter at the position x, based on a correlation between an arithmetical mean value I(x) and an hole diameter of the holey optical fiber that is obtained in advance.
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