Invention Grant
US09176057B2 Apparatus and method for measuring retroreflectivity of a surface
有权
用于测量表面的后向反射率的装置和方法
- Patent Title: Apparatus and method for measuring retroreflectivity of a surface
- Patent Title (中): 用于测量表面的后向反射率的装置和方法
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Application No.: US13576044Application Date: 2011-02-04
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Publication No.: US09176057B2Publication Date: 2015-11-03
- Inventor: Kaj Sørensen , Asbjørn Mejnertsen , Jan Harries Hansen , Hans Ole Nielsen
- Applicant: Kaj Sørensen , Asbjørn Mejnertsen , Jan Harries Hansen , Hans Ole Nielsen
- Applicant Address: DK Horsholm
- Assignee: DELTA DANSK ELEKTRONIK, LYS & AKUSTIK
- Current Assignee: DELTA DANSK ELEKTRONIK, LYS & AKUSTIK
- Current Assignee Address: DK Horsholm
- Agency: Michael Best & Friedrich LLP
- Agent Lisa V. Mueller
- Priority: DK201070040 20100204
- International Application: PCT/EP2011/051682 WO 20110204
- International Announcement: WO2011/095605 WO 20110811
- Main IPC: G01N21/55
- IPC: G01N21/55

Abstract:
An apparatus for measuring the retroreflectivity of a surface. The apparatus comprises a light source for illuminating an area of said surface at an incident angle relative to the surface; a detector for detecting light reflected back from the surface at an observation angle relative to the surface; a signal processing unit adapted to receive a detector signal from the detector and to determine, from at least the received detector signal, a measure of retro reflectivity of the surface; a range finder for measuring a distance between the apparatus and the illuminated area. The signal processing unit is further adapted to adjust the measure of retroreflectivity responsive to the measured distance.
Public/Granted literature
- US20130194565A1 APPARATUS AND METHOD FOR MEASURING RETROREFLECTIVITY OF A SURFACE Public/Granted day:2013-08-01
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