Invention Grant
US09177671B2 Memory with bit line capacitive loading 有权
具有位线电容负载的存储器

Memory with bit line capacitive loading
Abstract:
A memory that may allow for the detection of weak data storage cells may include data storage cells, a column multiplexer, a sense amplifier, and a load circuit. The load circuit may include one or more capacitive loads and may be operable to controllably select one or more of the capacitive loads to couple to the input of the sense amplifier.
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