Invention Grant
- Patent Title: Manufacturing method of semiconductor device
- Patent Title (中): 半导体器件的制造方法
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Application No.: US14324626Application Date: 2014-07-07
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Publication No.: US09177921B2Publication Date: 2015-11-03
- Inventor: Shiro Tan , Kazuhiro Fujimaki , Yu Iwai , Ichiro Koyama , Atsushi Nakamura
- Applicant: FUJIFILM CORPORATION
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2012-046856 20120302; JP2012-134188 20120613
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L23/00 ; H01L21/67 ; H01L21/683

Abstract:
A method for manufacturing a semiconductor device with a treated member, includes: subjecting an adhesive support having a substrate and an adhesive layer capable of increasing or decreasing in adhesiveness upon irradiation with an actinic ray, radiation or heat to irradiation of the adhesive layer with an actinic ray, radiation or heat, adhering a first surface of a to-be-treated member to the adhesive layer of the adhesive support, applying a mechanical or chemical treatment to a second surface different from the first surface of the to-be-treated member to obtain a treated member, and detaching a first surface of the treated member from the adhesive layer of the adhesive support, wherein the irradiation of the adhesive layer with an actinic ray, radiation or heat is conducted so that adhesiveness decreases toward an outer surface from an inner surface on the substrate side of the adhesive layer.
Public/Granted literature
- US20140322893A1 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE Public/Granted day:2014-10-30
Information query
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