Invention Grant
US09178544B1 Parameter offset estimation through use of a secondary signal collected from multiple sensors
有权
通过使用从多个传感器收集的辅助信号进行参数偏移估计
- Patent Title: Parameter offset estimation through use of a secondary signal collected from multiple sensors
- Patent Title (中): 通过使用从多个传感器收集的辅助信号进行参数偏移估计
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Application No.: US13788520Application Date: 2013-03-07
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Publication No.: US09178544B1Publication Date: 2015-11-03
- Inventor: Wei Su
- Applicant: The United States of America, as represented by the Secretary of the Army
- Applicant Address: US DC Washingon
- Assignee: The United States of America, as represented by the Secretary of the Army
- Current Assignee: The United States of America, as represented by the Secretary of the Army
- Current Assignee Address: US DC Washingon
- Agent Azza Jayaprakash
- Main IPC: H04B3/46
- IPC: H04B3/46 ; H04B1/10 ; H04L1/00 ; H04L27/26 ; H04W4/00

Abstract:
Various embodiments associated with estimating a parameter offset for editions of a signal of interest through use of a secondary signal are described. A plurality of distributed asynchronous sensors can capture editions of a signal of interest as well as editions of a secondary signal. The secondary signal can be much stronger than the signal of interest. Since individual sensors capture the signal of interest editions and the secondary editions, offset calculated for one can be used for the other. With the secondary signal being stronger than the signal of interest, the offset of the editions of the signal of interest can be estimated. Once the offset is estimated for the secondary editions, the offset can be used for the signal of interest editions. After the offset is used to align the signal of interest editions, the signal of interest editions can be combined and further processing can occur.
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