Invention Grant
- Patent Title: Image processing apparatus and inspecting method thereof
- Patent Title (中): 图像处理装置及其检查方法
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Application No.: US13950797Application Date: 2013-07-25
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Publication No.: US09179142B2Publication Date: 2015-11-03
- Inventor: Kang-young Won
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-Si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-Si
- Agency: Staas & Halsey LLP
- Priority: KR10-2012-0084540 20120801
- Main IPC: H04N17/00
- IPC: H04N17/00 ; H04N17/02 ; H04N17/04 ; G06F11/22 ; G09G5/00 ; H04L1/24

Abstract:
An image processing apparatus including: at least one connector including at least one connection pin configured to be connected to an external device; an interface which interfaces transmission of signals to the connection pin through a first wiring formed between the interface and the connection pin; a switching unit which is switched on to transmit a signal through a second wiring which is formed differently from the first wiring to feedback the signal from the connection pin to the interface; a controller which controls the switching unit to allow the feedback of the signal through the second wiring to transmit a preset test signal from the interface to the first wiring at the time of inspecting a signal transmission state of the connection pin and the first wiring, and determines the signal transmission state based on a change of the test signal feedbacked to the interface through the second wiring.
Public/Granted literature
- US20140036094A1 IMAGE PROCESSING APPARATUS AND INSPECTING METHOD THEREOF Public/Granted day:2014-02-06
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