Invention Grant
- Patent Title: 3D data analysis apparatus and 3D data analysis method
- Patent Title (中): 3D数据分析仪器和3D数据分析方法
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Application No.: US13989000Application Date: 2011-11-25
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Publication No.: US09185394B2Publication Date: 2015-11-10
- Inventor: Shunsuke Suzuki , Atsuo Fujimaki
- Applicant: Shunsuke Suzuki , Atsuo Fujimaki
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sony Corporation
- Priority: JP2010-269945 20101203
- International Application: PCT/JP2011/077196 WO 20111125
- International Announcement: WO2012/073825 WO 20120607
- Main IPC: G06K9/00
- IPC: G06K9/00 ; H04N13/04 ; G06T19/20 ; G01N15/14

Abstract:
The present invention provides a 3D data analysis apparatus and a 3D data analysis method.A 3D data analysis apparatus including a data storage unit that stores measurement data of microparticles, an input unit that selects three kinds of variables independent of the measurement data, a data processing unit that calculates positions and graphics in a coordinate space with the three kinds of variables being coordinate axes and creates a 3D stereoscopic image that represents a characteristic distribution of the microparticles, and a display unit that displays the 3D stereoscopic image, and the 3D data analysis apparatus variably sets a separate area in the coordinate space on the basis of an input signal from the input unit and displays the area in the 3D stereoscopic image.
Public/Granted literature
- US20130251242A1 3D DATA ANALYSIS APPARATUS AND 3D DATA ANALYSIS METHOD Public/Granted day:2013-09-26
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