Invention Grant
US09188529B2 Holographic microrefractometer for determining refractive index of a medium
有权
用于确定介质的折射率的全息微型折射仪
- Patent Title: Holographic microrefractometer for determining refractive index of a medium
- Patent Title (中): 用于确定介质的折射率的全息微型折射仪
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Application No.: US14380286Application Date: 2013-02-21
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Publication No.: US09188529B2Publication Date: 2015-11-17
- Inventor: Hagay Shpaisman , Bhaskar Jyoti Krishnatreya , David G. Grier
- Applicant: New York University
- Applicant Address: US NY New York
- Assignee: NEW YORK UNIVERSITY
- Current Assignee: NEW YORK UNIVERSITY
- Current Assignee Address: US NY New York
- Agency: Foley & Larnder LLP
- International Application: PCT/US2013/027112 WO 20130221
- International Announcement: WO2013/126554 WO 20130829
- Main IPC: G01N21/45
- IPC: G01N21/45 ; G01N21/41 ; G02B21/36 ; G01N15/14 ; G01N21/47

Abstract:
An in-line holographic microscope is used for measurements of micrometer-scale particles and associated suspending fluid medium containing the particles. The system yields heterodyne scattering patterns that may be interpreted with Lorenz-Mie theory to obtain precise time-resolved information on the refractive index of the suspending medium for determining chemical composition, concentrations and makeup thereof. This approach can perform spatially resolved refractometry with measurements on calibrated refractive index standards and monitor chemical concentration in a microfluidic channel. Using commercially available colloidal spheres as probe particles and a standard video camera for detection yields volumetric refractive index measurements with a resolution of 2×10−3 RIU for each probe particle in each holographic snapshot.
Public/Granted literature
- US20150062587A1 HOLOGRAPHIC MICROREFRACTOMETER Public/Granted day:2015-03-05
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