Invention Grant
- Patent Title: Tester apparatus for obtaining forming limit diagram
- Patent Title (中): 用于获得成形极限图的测试仪器
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Application No.: US13709869Application Date: 2012-12-10
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Publication No.: US09189592B2Publication Date: 2015-11-17
- Inventor: Ki Ju Nam , Jun Beom Lee , Yong Kyun Cho
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-Si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-Si
- Agency: Staas & Halsey LLP
- Priority: KR10-2011-0135311 20111215
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G01N3/08 ; G01N3/04 ; B21D22/02

Abstract:
A tester apparatus capable of obtaining a forming limit diagram pertaining to a sample having a high degree of precision includes a fixing jig and a mobile jig installed at an upper side of the fixing jig so as to enable a vertical movement. The mobile jig may be configured to fix the sample in cooperation with the fixing jig, and a driving apparatus disposed at a lower side of the fixing jig may be configured to drive the vertical movement of the mobile jig. An interlocking apparatus provided in between the mobile jig and the driving apparatus may be configured to deliver a driving force of the driving apparatus to the mobile jig.
Public/Granted literature
- US20130152706A1 TESTER APPARATUS FOR OBTAINING FORMING LIMIT DIAGRAM Public/Granted day:2013-06-20
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