Invention Grant
- Patent Title: Sample analysis device
- Patent Title (中): 样品分析装置
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Application No.: US13002664Application Date: 2009-07-30
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Publication No.: US09194793B2Publication Date: 2015-11-24
- Inventor: Sakuichiro Adachi , Kunio Harada , Isao Yamazaki , Masaharu Kiyama , Takeshi Fujita
- Applicant: Sakuichiro Adachi , Kunio Harada , Isao Yamazaki , Masaharu Kiyama , Takeshi Fujita
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Baker Botts L.L.P.
- Priority: JP2008-196337 20080730
- International Application: PCT/JP2009/063573 WO 20090730
- International Announcement: WO2010/013777 WO 20100204
- Main IPC: G01N21/59
- IPC: G01N21/59 ; G01N21/25 ; G01N35/02 ; G01N21/03 ; G01N35/00 ; G01N35/04

Abstract:
Using an LED element as a light source, a photometric unit including the light source, a light receiving element and other components therebetween is reduced in size. A holder 30 detachable from the device as a unit holds a light emission unit 15 formed of an LED and a light receiving element 21, and the holder is placed inside a thermostatic chamber 18 which holds a constant temperature fluid 17. Thus, the photometric unit is reduced in size.
Public/Granted literature
- US20110110822A1 SAMPLE ANALYSIS DEVICE Public/Granted day:2011-05-12
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