Invention Grant
US09194876B2 Sample inspection system and operating method for management server thereof
有权
样品检验系统及其管理服务器的操作方法
- Patent Title: Sample inspection system and operating method for management server thereof
- Patent Title (中): 样品检验系统及其管理服务器的操作方法
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Application No.: US12729787Application Date: 2010-03-23
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Publication No.: US09194876B2Publication Date: 2015-11-24
- Inventor: Tatsuya Tokunga , Naomi Ishii , Takashi Noguchi , Masaki Takano , Yayoi Shitara
- Applicant: Tatsuya Tokunga , Naomi Ishii , Takashi Noguchi , Masaki Takano , Yayoi Shitara
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Baker Botts L.L.P.
- Priority: JP2009-083964 20090331
- Main IPC: G01N1/28
- IPC: G01N1/28 ; G01N1/02 ; G01P15/16 ; G01F3/00 ; G01N35/00

Abstract:
A management server of a sample inspection system includes sample processing information generated on the basis of inspection request data, facility data, a simulation execution portion and a window generation portion for generating a monitor window. The inspection request data contains a priority, an order time, a required time and inspection items and the sample processing information contains an inspection start time and an inspection estimate finish time. The monitor window has a work area in which the samples represented by sample bars parallel to the abscissa are arranged in a vertical direction and a past record and a future schedule are allocated to this abscissa with the present time as the base. The sample bars display a simulation execution portion for executing simulation on the basis of the inspection start time, the inspection estimate finish time and a delay time. The management server displays the simulation result.
Public/Granted literature
- US20100250174A1 SAMPLE INSPECTION SYSTEM AND OPERATING METHOD FOR MANAGEMENT SERVER THEREOF Public/Granted day:2010-09-30
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