Invention Grant
- Patent Title: Nonvolatile semiconductor memory device and read method thereof
- Patent Title (中): 非易失性半导体存储器件及其读取方法
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Application No.: US14016517Application Date: 2013-09-03
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Publication No.: US09196371B2Publication Date: 2015-11-24
- Inventor: Ayako Yamano , Norihiro Fujita , Hitoshi Shiga
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Minato-ku
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2013-046070 20130308
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C16/26 ; G11C16/04 ; G11C16/20

Abstract:
A nonvolatile semiconductor memory device includes a memory cell array and a control circuit. The memory cell array comprises a plurality of memory cells and stores initial setting data in the plurality of memory cells. The control circuit is configured to apply a first voltage to gates of the plurality of memory cells to read the initial setting data and, depending on that read result, apply a second voltage different from the first voltage to the gates of the plurality of memory cells to read the initial setting data.
Public/Granted literature
- US20140254261A1 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND READ METHOD THEREOF Public/Granted day:2014-09-11
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